Lyncee Tec DHM R-series

The Digital Holographic Microscopy (DHM®) is a patented technology. It records, with a digital camera, holograms produced by the interference between the beam reflected by the sample, and a reference beam generated inside of the microscope. The holograms are processed numerically to reconstruct a 3D optical map of the specimen.

The vertical calibration of DHM® is intrinsically defined by the laser wavelength. It provides high accuracy and reproducible data and measures with interferometric resolution, i.e. a subnanometric vertical resolution, and a lateral resolution limited by the choice of microscope objective.

Thanks to advanced numerical processing of the recorded hologram, sharp focus can be performed simultaneously or after measurement, as a post-processing without manually adjusting the height of the sample.

Description

The DHM® – R series is a reflection configured Digital Holographic Microscope (DHM®), providing a non-scanning and non-contact method for static and dynamic 3D topography as well as vibration characterization. It measures the 3D topography map of a surface with a single acquisition, without any scanning mechanism required. It provides unbeatably fast acquisition, at camera rates of up to 100,000 fps, enabling routine inspections with high productivity and the capture of 3D topographies on the production line without stopping the sample.

The vertical calibration of DHM is intrinsically defined by the laser wavelength, providing high accuracy, reproducible data, and a subnanometric vertical resolution. Thanks to advanced numerical processing of the recorded hologram, sharp focus can be performed simultaneously or after measurement as post-processing, without manually adjusting the height of the sample.

DHM-R measuring through a glass window

Three configurations are available based on the number of wavelengths:

  • R1000 models: Configured with a single wavelength; the ideal tool for measuring smooth surfaces and vibrations.
  • R2100 models: Configured for measuring simultaneously at two wavelengths for achieving measurement of complex or discontinuous structures.
  • R2200 models: R2100 with a third source to extend measurement capability, in particular for measuring transparent patterns.

Applications

  • MEMS Analysis up to 25 MHz: Out-of-plane vibration amplitude resolution of 5pm and in-plane displacement resolution of 1nm using an optional stroboscopic unit. It provides a time-sequence of 3D topographies, frequency resonances, and responses.
  • Deformable & Soft Samples: Study of the 3D dynamic behavior of deformable samples and topography of soft materials and liquids.
  • Large Surface Screening: Fast screen and analysis of large surfaces.
  • Controlled Environmental Measurements: Measurements through glass and immersion liquids, or inside environmental and vacuum chambers under controlled temperature, humidity, pressure, or gas composition.
  • Transparent Patterns & Multi-layers: Measurement of the topography of transparent structures, thicknesses, and refractive index values of structured multi-layers ranging from 10 nanometers to tens of microns.

Time sequence of 3D topographies, limited by camera rate : evaporation of a liquid drop

Specifications

System
DHM modelsR1000R2100R2200
Number of laser sources123
Operating wavelength (± 1.0 nm)675 nm675 nm, 794 nm666 nm, 794 nm, 675 nm
Laser wavelength stability0.01 nm/°C at 675 nm
Sample stageManual or motorized XYZ stages up to 300 mm x 300 mm x 38 mm travel range
ObjectivesMagnification 1.25x to 100x, standard, high NA, long working distance, water/oil immersion
Objective turret6 positions
ComputerWorkstation with latest multicore Intel® processor, high performance graphic card optimized and configured for DHM with screen min 21inch and mouse
SoftwareProprietary Koala software based on C++ and .NET Additional optional software modules available for advanced analysis
Data compatibilityMeasurement data recorded in bin format, exportable in .txt format, recorded and reconstructed images exportable in .tif format or .txt array
Performance
Measurement modeSingle wavelength at 675 nmShort synthetic wavelength at 4.4 μmLong synthetic wavelength at 50 μm
DHM modelsR1000, R2100, R2200R2100, R2200R2200
Accuracy 1[nm]0.150.15 / 3.0 *20
Vertical resolution 2[nm]0.30.30 / 6.0 *40
Repeatability 3[nm]0.010.01 / 0.1 *0.5
Vertical measuring rangeup to 200 μmup to 200 μmup to 200 μm
Max. height of steps with sharp edgesup to 333 nm4up to 2.1 μm4up to 24 μm4
Surface typeSmooth surfacesComplex or discontinuous structuresComplex or discontinuous structures
Vertical calibrationDetermined by interferometric optical filter, ±0.1 nm
Acquisition timeStandard: 500 μs (optional 10 μs)
Acquisition rateStandard: 190 fps (1024 x 1024 pixels). (optional up to 100'000 fps).
Reconstruction rateUp to 25 fps 1024 x 1024 pixels hologram (data analysis dependent ). (optional up to 60 fps )
Lateral resolutionObjective dependent, down to 300 nm **
Field of viewObjective dependent, from 66 μm x 66 μm up to 5 mm x 5 mm **
Working distanceObjective dependent, from 0.3 to 18 mm **
Digital focusing rangeUp to 50x depth of field (objective dependent)
Min. sample reflectivityLess than 1%
Sample illuminationDown to 1 μW/cm2
Stroboscopic unitCompatibility with single and short synthetic wavelength
Power requirements
Input voltage85-260 VAC – 50/60 Hz
Power requirementsmax. 250 W
Dimensions & weight
Dimensions (L x W x H)600 x 600 x 800 mm
Weight48kg
1 As demonstrated by taking the temporal standard deviation on 1 pixel over 30 measurements
2 Defined as twice the accuracy
3 As demonstrated by taking the one sigma Rq value of 30 repeatability measurements without sample
4 Depends on the laser source(s) and operating wavelength(s)
* With / Without single wavelength mapping
** Objectives specifications on www.lynceetec.com/microscope-objectives

Options

  • Objectives with extra-LWD, cover-glass correction, for immersion, etc.
  • Motorized stage for automation and stitching
  • Remote TCP/IP module for automation and remote control of DHM
  • Stroboscopic unit for MEMS analysis
  • Environmental chamber for measuring under controlled conditions