NIR Testing Techniques for MEMS Devices
Introduction:In semiconductor manufacturing, fully automated wafer defect inspection during the early stages is critically important. In the backend process, multiple…
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Photoluminescence And Electroluminescence characteristics testing of InGaN/GaN Quantum Well
Introduction Since the early 1990s, there has been a worldwide surge of interest in the development of high-brightness light-emitting diodes…
Dynamic Liquid Surface Enhanced Raman Scattering Platform Based on Soft Tubular Microfluidics for Label-Free Cell Detection
Introduction: Surface-enhanced Raman spectroscopy (SERS) refers to the phenomenon where enhanced electromagnetic fields on sample surfaces significantly enhance the Raman…